Daniel P. Siewiorek, Fellow IEEE, Ram Chillarege, Fellow IEEE, and Zbigniew T. Kalbarczyk, Member IEEE Carnegie Melon University, Chillarege Inc, & University of Illinois, 2004
Abstract -- Experimental research in dependability has evolved over the past 30 years accompanied by dramatic changes in the computing industry. To understand the magnitude and nature of this evolution, this paper analyzes industrial trends, namely: 1) shifting error sources, 2) explosive complexity, and 3) global volume. Under each of these trends, the paper explores research technologies that are applicable either to the finished product or artifact, and the processes that are used to produce products. The study gives a framework to not only reflect on the research of the past, but also project the needs of the future.
Index Terms—Experimental research in dependability and security, computing industry trends.
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