Visualising the unobservable - NIST, Washington DC

Orthogonal Defect Classification (ODC) is a concept that enables software developers to derive in-process feedback by extracting semantics from data that is already tracked in most organizations. The data and analytics assists in visualizing a process that typically evades visibility. This is analogous to the way magnetic resonance imaging (MRI) equipment aids a physician to have a rough idea of how a human being looks on the inside without knowing anything about the specific patient. ODC creates a new order of capability to gain insight and clarity. It can be used to profile market segments, evaluate processes and tools, and factor the impact of legacy code. Security bugs can be profiled to understand their circumstances and characteristics. Today many of the networks in mobile telephone have used ODC to improve their reliability and availability. Similarly, ODC has helped manage the process and quality of software in diesel engine controllers that ply on our roads. This talk aims to provide an overview of ODC and share a couple of case studies. It will be of interest to computer scientists, developers, architects, testers, service and product management. No specific background other than awareness of software engineering is required in order to attend this talk. One of the objectives of Dr Chillarege's talk is for different disciplines to reflect on how ODC can help current business challenges and accelerate their engineering processes.

Dr Ram Chillarege, President of Chillarege Inc. and chair of the IEEE Steering committee for Software Reliability , will be speaking about Orthogonal Defect Classification (ODC) at 11 am, Friday December 6th, at NIST, Washington DC.