ODC - Orthogonal Defect Classification

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Defect Type and its Impact on the Growth Curve

Ram Chillarege, Wei-Lun Kao[1]Was a summer student from Univ. of Illinois at Urbana-Champaign. and Richard G. Condit

IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598



rchill
Thu Apr 1 16:01:58 EST 1999