ODC - Orthogonal Defect Classification

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Abstract

This paper presents an empirical investigation on possible cause and effect relationships between defects and the development process. Establishing such relationships is critical to make software development into a process with greater understanding and control. This paper:

  • uses defect data from an operating systems development project.
  • finds that initialization defects were strongly related to the inflection noticed in the reliability growth.
  • finds that the defect type distribution identified process problems that concurred with the developers' hind sight.
Thus, we show that it is plausible that there exist other cause-effect relationships that could be identified. The impact of this finding is that it could well pave the way for a more systematic process control methodology to be applied to software development.



rchill
Thu Apr 1 16:01:58 EST 1999