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	ODC - Orthogonal Defect Classification
	Next: Defect Type and its Up: No Title Proceedings 13th International Conference on Software Engineering, May 13-17, 1991, Austin Texas. Copyright IEEE Defect Type and its Impact on the Growth Curve Ram Chillarege, Wei-Lun Kao[1] and Richard G. Condit IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598 Abstract This paper presents an empirical investigation on possible cause and effect relationships between defects and the development process. Establishing such relationships is critical to make software development into a process with greater understanding and control. This paper: uses defect data from an operating systems development project. finds that initialization defects were strongly related to the inflection noticed in the reliability growth. finds that the defect type distribution identified process problems that concurred with the developers' hind sight. Thus, we show that it is plausible that there exist other cause-effect relationships that could be identified. The impact of this finding is that it could well pave the way for a more systematic process control methodology to be applied to software development. 1. Introduction 2. Defect Data 3. Analysis by Failure Symptom Identification of Sub-populations 4. Analysis by Defect Type 5. Relating Defect types to Symptom Groups 6. Conclusions Acknowledgments References Appendix - Defect Data About this document ... [1] Was a summer student from Univ. of Illinois at Urbana-Champaign.

ODC - Orthogonal Defect Classification

Defect Type and its Impact on the Growth Curve

Abstract