ODC - Orthogonal Defect Classification

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Proceedings, ASQC. Copyright.

ODC for Process Measurement, Analysis and Control

Ram Chillarege
IBM TJ Watson Research Center, Yorktown Heights, NY
(914) 784 7375 ramchill@watson.ibm.com

Abstract:

This paper provides the motivation and overview of Orthogonal Defect Classification (ODC), a new technology for software process measurement and analysis. ODC provides a significant step forward in being able to understand the dynamics of software development by using classification of defects, so that they provide measurements. This breakthrough is being used at several IBM labs and is now supported by several processes, analyses and tools from the Thomas J. Watson Research Center.

• Introduction to Software Defects
  • Defects during development
  • Defects in the field
• In-Process Measurement
  • The Gap - cause and effect relationship
  • The birth of ODC
• Key Concepts in ODC
  • Distribution change as a measurement
• Deploying ODC at IBM
• Summary
• References
• About this document ...