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ODC - Orthogonal Defect Classification |
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About this document ...Identifying Risk Using ODC Based Growth Models Fifth International Symposium on Software Reliability Engineering, November 1994, Monterey, CA - IEEE Computer Society. Copyright, IEEE.
This document was generated using the LaTeX2HTML translator Version 96.1-d (Mar 10, 1996) Copyright © 1993, 1994, 1995, 1996, Nikos Drakos, Computer Based Learning Unit, University of Leeds.
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