ODC - Orthogonal Defect Classification

Next: Introduction Up: Identifying Risk Using ODC

Proceedings Fifth International Symposium on Software Reliability Engineering, November 1994, Monterey, CA - IEEE Computer Society. Copyright IEEE.

Identifying Risk Using ODC Based Growth Models

Ram Chillarege and Shriram Biyani
IBM TJ Watson Research Center, Yorktown Heights, NY
(914) 784 7375 ramchill@watson.ibm.com

Abstract:

This paper uses the relative growth of defects, classified using Orthogonal Defect Classification to get a finer insight into dynamics of the software development process during later parts of testing. This is particularly useful to help identify management actions to better use people resources (both skill and staffing levels) to respond to difficulties experienced with the product in test. Specifically, the technique helps to:

• Identify the reasons for instability in the product demonstrated by growth modelling
• Evaluate the relative stability of specific aspects of the product, such as design, code, etc.
• Guide the choice of resource levels and skills necessary to respond to difficulties faced in the development process.

0=6 =10 .55 -0 =.9

0

• Introduction
• Background on ODC
• Subjective aspects of Growth Curves
• Combining ODC and Growth Modelling
• Real World Example
• Summary
• References
• About this document ...